Agilent Technologies launches In-Circuit Test Series
09/12/2009

Agilent Technologies introduces the Medalist i3070 Series 5 in-circuit test (ICT) platform.

Online PR News – 12-September-2009 – – Agilent Technologies introduces the Medalist i3070 Series 5 in-circuit test (ICT) platform. The Series 5 ICT system offers new analog measurement technology together with the industry's fastest 12 MHz hybrid pin card, giving electronic manufacturers 20 to 30 percent throughput improvement over the current i3070 at the same list prices.

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